Electron microscopy and analysis Ed 3
By: GOODHEW (Peter J);HUMPHREYS (John);BEANLAND (Richard)
Material type: 
TextLanguage: English Publisher: New York Taylor & Francis 2001Description: x,251 PBISBN: 978-0-7484-0968-6Subject(s): SciencesDDC classification: 502.825
| Item type | Current location | Collection | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Book
|
St Aloysius College PG Library | Physics | 502.825 GOOE (Browse shelf) | Available | PG013402 |
Total holds: 0
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