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Physical principles of electron microscopy: an introduction to TEM SEM and AEM

By: Material type: TextTextLanguage: English Publication details: New York Springer Verlag 2005Description: lx,202 HBISBN:
  • 978-0387-25800-0
Subject(s): DDC classification:
  • 502.825  23 EGEP
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Holdings
Item type Current library Collection Call number Status Barcode
Book Book St Aloysius PG Library Physics 502.825 EGEP (Browse shelf(Opens below)) Available PG013361
Total holds: 0

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