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Physical principles of electron microscopy: an introduction to TEM SEM and AEM

EGERTON (Ray F)

Physical principles of electron microscopy: an introduction to TEM SEM and AEM - New York Springer Verlag 2005 - lx,202 HB

ISBN: 978-0387-25800-0

Subjects--Topical Terms:
Sciences

Dewey Class. No.: 502.825 / EGEP

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