Physical principles of electron microscopy: an introduction to TEM SEM and AEM

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TextLanguage: English Publication details: New York Springer Verlag 2005Description: lx,202 HBISBN:

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Item type	Current library	Collection	Call number	Status	Barcode
Book	St Aloysius PG Library	Physics	502.825 EGEP (Browse shelf(Opens below))	Available	PG013361

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