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Physical principles of electron microscopy: an introduction to TEM SEM and AEM Ed 2

By: Material type: TextTextLanguage: English Publication details: Switzerland Springer Verlag 2016Edition: 2Description: xi,196 HBISBN:
  • 978-3-319-89876-1
Subject(s): DDC classification:
  • 502.825 EGEP
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Holdings
Item type Current library Collection Call number Status Barcode
Book Book St Aloysius PG Library Physics 502.825 EGEP (Browse shelf(Opens below)) Available PG014911
Total holds: 0

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