TY  - BOOK
AU  - Crawford, William.
AU  - Kaplan, Jonathan.
TI  - J2EE design patterns
SN  - 9788173667374
U1  - 006.671  1
PY  - 2003///
CY  - Mumbai
PB  - Shroff  Publishers and Distributors Pvt Ltd
KW  - The unified modeling language
KW  - Enterprise concurrency
KW  - Presentation tier scalability
ER  -