TY  - BOOK
AU  - EGERTON (R F)
TI  - Physical principles of electron microscopy: an introduction to TEM SEM and AEM Ed 2
SN  - 978-3-319-89876-1
U1  - 502.825 EGEP 
PY  - 2016///
CY  - Switzerland
PB  - Springer Verlag
KW  - Sciences
ER  -