EGERTON (R F) <br/><br/>
Physical principles of electron microscopy: an introduction to TEM SEM and AEM Ed 2 

 - 2 
 - Switzerland  Springer Verlag  2016 
 - xi,196  HB 
<br/><br/><label>ISBN: </label>978-3-319-89876-1 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Sciences
<br/><br/><label>Dewey Class. No.: </label>502.825 EGEP